Abstract

Reliability data and accurate compact models for new semiconductor processes are often very expensive to obtain. This paper considers low-cost collection of empirical data using COTS FPGAs and novel self-test. Hardware experiments using a 28 nm FPGA demonstrate isolation of small sets of transistors, detection of subtle aging, and measurement precision more than 10 finer 3060 femtoseconds than state of the art.

Date

March 24, 2015

Authors

Kenneth M Zick, Matthew French, Sen Li