Abstract

Reliability data and accurate compact models for new semiconductor processes are often very expensive to obtain. This paper considers low-cost collection of empirical data using COTS FPGAs and novel self-test. Hardware experiments using a 28 nm FPGA demonstrate isolation of small sets of transistors, detection of subtle aging, and measurement precision more than 10 finer 3060 femtoseconds than state of the art.

Date

2015

Authors

Kenneth M Zick, Matthew French, Sen Li